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特定功能逻辑 Scan Test Device A 5 95-SN74ABT8245DWR A A 595-SN74ABT8245DWR
- SN74ABT8245DW
- Texas Instruments
-
1:
¥83.959
-
100库存量
|
Mouser 零件编号
595-SN74ABT8245DW
|
Texas Instruments
|
特定功能逻辑 Scan Test Device A 5 95-SN74ABT8245DWR A A 595-SN74ABT8245DWR
|
|
100库存量
|
|
最低: 1
倍数: 1
|
|
|
|
SN74ABT8245
|
- 40 C
|
+ 85 C
|
SOIC-24
|
5.5 V
|
4.5 V
|
SMD/SMT
|
Tube
|
|
|
|
特定功能逻辑 Scan Test Devices AL T 595-SN74ABT8245DW ALT 595-SN74ABT8245DW
- SN74ABT8245DWG4
- Texas Instruments
-
1:
¥83.959
-
72库存量
|
Mouser 零件编号
595-SN74ABT8245DWG4
|
Texas Instruments
|
特定功能逻辑 Scan Test Devices AL T 595-SN74ABT8245DW ALT 595-SN74ABT8245DW
|
|
72库存量
|
|
最低: 1
倍数: 1
|
|
|
Boundry Scan JTAG Logic
|
SN74ABT8245
|
- 40 C
|
+ 85 C
|
SOIC-24
|
5.5 V
|
4.5 V
|
SMD/SMT
|
Tube
|
|
|
|
特定功能逻辑 Scan Test Device A 5 95-SN74ABT8245DW A A 595-SN74ABT8245DW
- SN74ABT8245DWR
- Texas Instruments
-
2,000:
¥42.5106
-
无库存交货期 12 周
|
Mouser 零件编号
595-SN74ABT8245DWR
|
Texas Instruments
|
特定功能逻辑 Scan Test Device A 5 95-SN74ABT8245DW A A 595-SN74ABT8245DW
|
|
无库存交货期 12 周
|
|
最低: 2,000
倍数: 2,000
:
2,000
|
|
|
|
SN74ABT8245
|
- 40 C
|
+ 85 C
|
SOIC-24
|
5.5 V
|
4.5 V
|
SMD/SMT
|
Reel
|
|
|
|
特定功能逻辑 Scan Test Device A 5 95-SN74ABT18245ADLR A 595-SN74ABT18245ADLR
- SN74ABT18245ADL
- Texas Instruments
-
1:
¥139.9505
-
60库存量
|
Mouser 零件编号
595-SN74ABT18245ADL
|
Texas Instruments
|
特定功能逻辑 Scan Test Device A 5 95-SN74ABT18245ADLR A 595-SN74ABT18245ADLR
|
|
60库存量
|
|
最低: 1
倍数: 1
|
|
|
|
SN74ABT18245A
|
- 40 C
|
+ 85 C
|
SSOP-56
|
5.5 V
|
4.5 V
|
SMD/SMT
|
Tube
|
|
|
|
特定功能逻辑 Scan Test Device A 5 95-SN74ABT18245ADL A 595-SN74ABT18245ADL
- SN74ABT18245ADLR
- Texas Instruments
-
1,000:
¥75.6874
-
无库存交货期 12 周
|
Mouser 零件编号
595-SN74ABT18245ADLR
|
Texas Instruments
|
特定功能逻辑 Scan Test Device A 5 95-SN74ABT18245ADL A 595-SN74ABT18245ADL
|
|
无库存交货期 12 周
|
|
最低: 1,000
倍数: 1,000
:
1,000
|
|
|
|
SN74ABT18245A
|
- 40 C
|
+ 85 C
|
SSOP-56
|
5.5 V
|
4.5 V
|
SMD/SMT
|
Reel
|
|
|
|
特定功能逻辑 Scan Test Device
- SN74ABT18245ADGGR
- Texas Instruments
-
2,000:
¥67.0881
-
无库存交货期 20 周
|
Mouser 零件编号
595-SNABT18245ADGGR
|
Texas Instruments
|
特定功能逻辑 Scan Test Device
|
|
无库存交货期 20 周
|
|
最低: 2,000
倍数: 2,000
:
2,000
|
|
|
Boundry Scan JTAG Logic
|
SN74ABT18245A
|
- 40 C
|
+ 85 C
|
TSSOP-56
|
5.5 V
|
4.5 V
|
SMD/SMT
|
Reel
|
|