嵌入式工具与配件

嵌入式工具与配件类型

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选择 图像 零件编号 制造商 描述 数据表 供货情况 单价(含13%增值税) 根据您的数量,按照单价筛选表格中的结果。 数量 RoHS
IAR Systems IJET-Trace-ARM-L
IAR Systems 硬件调试器 IAR I-jet Trace-ARM in-circuit debug probe with a capacity of up to 256 Mbytes of trace memory and USB3 port. Supports Cortex-M, Cortex-A and Cortex-R cores for real-time tracing and Cortex cores for plain debugging. Integrates into EWARM 7.70.1 and
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NXP Semiconductors LFK77CIDBZ2W1D
NXP Semiconductors 插座和适配器 MPC5777C Integrated Debug Board FCA 2A.17
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IAR Systems IJET-Trace-CM-XL
IAR Systems 硬件调试器 I-jet Trace CM Extra Large IAR I-jet Trace in-circuit debug probe with a capacity of 256 Mbytes of trace memory and USB3 port. Supports Cortex-M cores for real-time tracing and Cortex-cores for plain debugging. Integrates into EWARM 7.80 and later.
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