The device incorporates current reporting, temperature monitoring, fault detection, and PMBus support. The individual smart slaves detect overcurrent and overtemperature faults and faults communicated through the master IC. The highest junction temperature is reported both before and after smart-slave regulation.
The device features an integrated switching regulator that can optionally supply the VDD rail for the master controller and smart-slave devices to reduce the power-rail requirements and simplify the regulator design.
特性
- Increased power density with fewer external components needed
- Scalable, multiphase solution
- Compatibility with coupled inductors enables fast transient response and reduced COUT
- Integrated internal switching regulator to power smart slaves
- Optimized component performance and efficiency with reduced design-in time
- PMBus-compliant interface for telemetry and power management
- Field-programmable memory to allow storage of desired configuration parameters
- Fault logging
- Comprehensive system and IC self-protection features promote increased power-supply reliability
- Overcurrent and overtemperature
- Boost voltage UVLO
- VX short-to-ground or VDDH detection
- Phase-current steering for thermal balancing
- 36-Pin (6x6mm) QFN package
应用
- Communication, networking, servers, and storage equipment
- ASICs
- Microprocessor chipsets
- Memory VDDQ
- Other high-current digital ICs
Basic Application Circuit
发布日期: 2015-07-31
| 更新日期: 2023-04-13

